Slide 12 of 173
Notes:
The most practical method for test set generation is to develop a model of the physical defects that can occur in the fabricated device at a higher level of abstraction, typically the logic level, and then develop tests for these modeled faults. It is then usually a tractable problem to develop tests of all of the detectable modeled faults. Depending on the quality of the fault model, a test set developed in this manner will most often cover a large percentage of the actual physical defects.
