Slide 20 of 173
Notes:
The numerous advantages of the single stuck-at model are the reason it is most often used. It is simple to use during test generation and fault simulation; research has shown that it covers a large percentage of physical defects; and other fault models, that can increase defect coverage, can be mapped into sequences of single stuck-at faults.
There are however, some defects that cannot be covered by the single stuck-at model.
