Slide 41 of 173
Notes:
This graph shows the typical fault coverage vs. number of pseudorandom test vectors curve. Pseudorandom test generation is very efficient up to the point where the curve begins to flatten out (circuit dependent), and the deterministic ATPG is typically used to target the remaining undetected faults.
The way this is typically implemented is that pseudorandom tests are generated and fault simulated until two or more successive pseudorandom vectors fail to detect any new faults. Then the pseudorandom process is halted and deterministic ATPG is started.
