CURRENT READING ASSIGNMENT

11/22/99 - READ RASSP Module 43 (Test Technology Overview) for the 11/23 lecture -- this will be a good source of material for the fourth (and final) quiz next week.  Emphasis as per discussion in class (Overview only of first 80 slides -- testability issues and terminology, stuck-at fault models, purpose of fault simulation, etc.  In-depth consideration of Design for Testability, BIST, etc. in the second half of the module)  

11/12/99 -- Altera Technology-Specific Reading Assignment: in class on 11/18 I will provide an overview of specific details of the Altera families of FPGAs and their relevant architectural features.  I will use the MAX 7000 / 9000 family parts for specific examples of architectural features   Refer to the reference information on the EE497i Class CDROM, or go directly to the Altera Web Page for information.

11/4/99 -- Xilinx Technology-Specific Reading Assignment: an overview of specific details of the Xilinx families of FPGAs and their relevant architectural features are contained in their 3-day University seminar slides (see links below). Full and up-to-date details are contained in the Xilinx Databook -- study the XC4000 Product Family chapter of the "databook.pdf" file, or go on-line to the Xilinx Website for the XC4000E FPGA Family DataSheet.  Also, don't forget to look up the differences between the various XC4000 family parts (4000, 4000a, 4000E, 4000XL, 4000XV). Specific and up-to-date information about the entire Xilinx product line is available here. When you study the RASSP Testability Module (43), it will also be a good idea to review the IEEE1149.1 (JTAG) features and capabilities of the Xilinx 4000 family standard parts.

Xilinx University Seminar Day 1 -- Xilinx University Seminar Day 2 -- Xilinx University Seminar Day 3


PAST READING ASSIGNMENTS

 


GENERAL READING ASSIGNMENT info. (current and "legacy" links):


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Last Meddled With: 10/15/04 - D. Landis